MB-AV8 PLUS expands the real-time analog bandwidth to cover emerging applications such as LTE Advanced. With 32 fully independent instruments per board and an additional PMU at each pogo, it can also perform highly accurate DC measurements. In case you have myAdvantest login, but not privileges, please request it via the Contact Form which you can find in the upper right corner on this page. ; Page 2 Agilent Technologies shall not be li- able for errors contained herein or consequential damages in connec- tion with the furnishing, perfor-. Universal Analog Pin covers widest application range. Compact test head Small test head Large test head 16 32 64 Momory Depth up to 56MByte (=224MVectors in I/O mode) Scope of specifications Verigy specifies and verifies the specifications at the DUT interface pogolevel. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. Click on more information for further details. Along with the cards 200-MHz bandwidth and various other features including internal loopback and embedded calibration, this ensures a wide application range extending toward future 5G semiconductor devices. With it's breakthrough Direct Probe probe card interface technology the V93000 offers 4 times the component space on the probe card with optimal signal integrity to allow known good die testing with higher multisite already at probe. ProgramGenerator. Each channel can provide up to 80V and 10 amps. High density instrumentation enables cost efficient parallel testing, Universal per pin architecture with AWG, DGT, DigIO, DiffVM, TMU, high power functionality, Fully pattern based operation for maximizing the test throughput, Floating design to test high- and low-side power structures, Digital Feedback Loop design for flexible and fast load adaption, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and significantly lower cost of test, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, Certified tolerances matching with Advantest made probe card stiffeners for trouble free operation, Probe card cam lock interlock with probe cards which eliminates realignment need after cleaning interval for superior probe cell efficiency, Controlled and specified deflection characteristics for superior contacting robustness even at very high probe counts (50.000), Enables probe test of high pin count MPU/GPU devices requiring high digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. Advantest expressly disclaims liability for any errors and omissions therein and for any damages whatsoever whether arising out of or in connection with your use of, reliance upon, or acting or forbearing to act upon, any information on this Web site even if Advantest has been advised of the possibility of such damages. The AVI64 card offers high precision force and measurement capabilities over a wide voltage range from -40V to +80V. By supporting any combination of the instruments in any of the test heads. Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. 0000057829 00000 n yc+5I|w&-/-6d0E^ [6cf,/* If there is a survey it only takes 5 minutes, try any survey which works for you. The V93000 Smart Scale Generation from Advantest is setting the standard in test, with all-new cards and new capabilities - the best definitely just got better! 0000009606 00000 n The drive for more functions per die, the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. Additional efficiencies are gained from the consistent software platform, the same hardware modules from one system to the next (digital, analog, RF, etc.) Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. With its scalable platform architecture, the V93000 tests a wide range of devices, from low cost IoT to high end, such as advanced automotive devices or highly integrated multicore processors. Direct Probe is mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. 0000014977 00000 n 0000033254 00000 n Agenda www.chiptest.in 3. Meeting todays test needs requires not only innovative technology, but also an extendable system architecture to ensure long equipment lifetime, for the greatest return on customers capital investment. Click on more information for further details. Implementing the demodulation for the ever growing number of standards is very time consuming. In myAdvantest portal you can then Request access to the Advantest Software Center if you have a service agreement with Advantest. 0000006892 00000 n The eight-channel PVI8 floating power source provides the capability to conduct highly parallel, cost-efficient test of embedded power devices. Extends Highly Parallel Testing Capabilities. ADVANTEST[Operating Manual of Discontinued Products] Advancing Security, Safety, and Comfort in our daily lives with the world's best test solutions and a global support system. 83K/93K, T2000, T6575, D10 & Catalyst ATE Expertise Scan/ATPG Tools Usage, Memory Repair, Bitmap generation . 0000018400 00000 n 0000017827 00000 n For high-power stress testing multiple channels can be ganged up to 80 amps or stacked up to 160 volts due to its floating design. Combined with the high density DUT power supply DPS128 the solution offers highly parallel test capability for MCUs with embedded analog cores as well as SmartCards and NFC controllers. Designed for highly parallel multi-site and in-site parallel testing, the new #V93000 Wave Scale RF and V93000 Wave Scale MX cards substantially reduce the cost of test and time to market for today's RF #semiconductors while creating a path for testing future 5G devices.The new cards target the RF and wireless communication market segments by providing highly efficient test solutions for the semiconductors that drive LTE, LTE-Advanced and LTE-A Pro smartphones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and #IoT applications. V93000 Visionary and Enduring Architecture. High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. 0000079792 00000 n This enhancement gives the V93000 sufficient power and enough analog and digital channels on a single platform to conduct highly parallel, cost-efficient testing of embedded power ICs. ]J>\+I4MK{JeT L"||UuRp5L] jz#z F3.!6k:X+L +M X7U>IN4Y/0b = {JUZk;b8Ad6j);ihi[$ TSE: 6857. 810~11. TSE: 6857. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Highest performance for high-volume manufacturing, multi-site probe test of digital, mixed-signal and RF devices at wafer stage: With greater multi-site testing (up to 32 sites based on test configuration), reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. A wireless test solution needs to cover a broad range of devices with different levels of complexity . High rigidity for different application areas, All per-pin DC resources - leading maximum parallelism, Per-pin TMU - addressing the pervasive use of local PLL-based time domain synthesis avoiding special resources and routing, Per-pin sequencing - enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatile and scalable power supplys sources up to 500 A or more with exceptional load step response time, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional tests. 0000016567 00000 n V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 300 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. 0000237580 00000 n RF is ubiquitous, found in cell phones, satellite-based navigation, tuners, set-top boxes, WLAN, Bluetooth, FM Radio, UWB, PCs and laptops. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analogas well as the lowest noise floor. The Advantest bridge beams are specifically designed to match all application areas, featuring cut outs to provide the required instrument space, so that the new front-end modules can access the DUT interface board / probe card. Smart Test, Smart ATE, Smart Scale. The result: excellent mechanical and electrical contact is assured. Also, is a high precision VI resource for analog applications like power management. 0000018675 00000 n By clicking any link on this page you are giving consent for us to set cookies. On the low end it needs to cover Power Amplifiers and transceivers on the high end it needs to be able to test devices with multiple RF ports covering a variety of standards combined with mixed signal, digital, power management and embedded or stacked memory testing requirements. Advantest. The V93000 Smart Scale Generation extends the V93000 for the broadest device coverage in a single platform with a full range of compatible tester classes (from the smallest A-class to the largest L-class) to maximize your return-on-investment. Founded in Tokyo in 1954, Advantest is a global company with facilities around the world and an international commitment to sustainable practices and social responsibility. 0000011683 00000 n ; Page 3: Table Of Contents Contents Unit 1 Introduction Lesson 1 Training Overview About This Training 15 The Study Material 19 Lesson 2 Introduction to the Test . With higher quality signals, the control and performance needed for accurate stimulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. 0000059009 00000 n The result: excellent mechanical and electrical contact is assured. Click on more information for further details. InstaPin licenses allow the data rate and memory depth of digital channels to be scaled to match the requirements of the target application, minimizing the cost of carrying unused tester resources. Semiconductor test equipment supplier Advantest has introduced the newest generation of its Wave Scale RF channel cards for the V93000 platform to address the growing market demand for Wi-Fi 6E, 5G-NR transceivers, LTE-Advanced Pro and IoT communication devices operating at frequencies up to 8GHz. V93000 SmarTest System Software Downloads, Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 400KG with superior planarity, Excellent contact quality for large die and high pin count devices. After completion the student will be familiar with the following: Advantest Corporation 0000061569 00000 n This paragraph applies only to the extent permitted by applicable law. EVA100 Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors AirLogger Superior x/y repeatability after cleaning step. 0000059144 00000 n The PowerMUX card offers a "sea of switches" for individual usage in typical power applications. 0000058497 00000 n 0000059227 00000 n 0000010927 00000 n Key Features Increased modulation support for 5G NR FR1 and FR2 FEM sub-8.5 GHz Immediate Wi-Fi 6/6E/7 including 7.126 GHz band Building blocks for 5G NR FR2 mmWave 23.45 - 48.5 GHz Configurable with up to 32 Universal RF ports Up to 8.5 GHz RF modulated source and 8.5 GHz RF measure Noise source available on all ports (-{Q&.v1xRYdI~.4 nd|7I:aN!OM The cards 300-MHz bandwidth allows it to handle the most advanced modulation standards while its flexible I/O matrix reduces loadboard complexity and boosts multi-site testing efficiency. While other systems test one RF standard per site at a time, this card enables simultaneous testing of multiple standards or multiple paths within each DUT. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. ATE to ATE Conversion. Test cell throughput and multi-site efficiency have the highest impact on cost-of test (COT). The platform has become the all purpose reference platform. 0000031852 00000 n The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. 0000008392 00000 n More information is available at www.advantest.com The more that could be run in parallel, the greater the test time savings. Very high speed I/O technology, SerDes based (such as PCIe, USB, HDMI.. ) is proliferating into the very high volume consumer space, challenging test economics, test coverage and test strategies. bT$nb$Zk5DUVR:;Vj}ow+8S(CfM2r%o90!h-/9' With higher quality signals, the control and performance needed for accurate simulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. All card types fit in all test heads, which provide the same power, cooling and computer interfacing to each card, independent of tester size. It improves throughput while maintaining compatibility with the established MBAV8 instrument. TEAM A.T.E. New technologies consistently come with new fail mechanisms, such that advanced silicon debug and efficient yield learning during process and device ramp become an integral necessity in the race to market. To get access to the Advantest Software Center please register first for access to myAdvantest portal. 0000007396 00000 n The V93000 Port Scale RF architecture makes key contributions in several dimensions: WLCSP require test coverage of final test at probe to enable known good die testing. Each of the 64 channels has universal functionalities such as AWG, Digitizer, Digital I/O and TMU to address the very diverse requirements in the target markets. Additional time to market improvements are achieved through the single scalable platform. Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency (RF) and mixed-signal #ICs for wireless communications. 0000014447 00000 n The cards innovative architecture allows simultaneous and fully independent testing on as many as 32 instruments with totally different settings, significantly reducing the cost of test for complex mixed-signal devices. 0000009749 00000 n TSE: 6857. 0000007336 00000 n Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 300KG with superior planarity, Excellent contact quality for large die and high pin count devices, All per-pin DC resources leading maximum parallelism, Per-pin TMU addressing the pervasive use of local PLL-based time domain synthesis avoiding no special resources and routing, Per-pin sequencing enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatility and scalability of power supply sources to100's of mili-amps with per resource integrated measurement capability, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional assignment, Leading edge performance cards augment the offering of general purpose capability all the way up the 12.8 GB/s with Pin ScaleSL, Optimized throughput with zero overhead background upload and background calculations enabled by SmartCalc, Very high multi-site efficiency in terms of both throughput and tester resource utilization enabled by Advantest's unique tester per-pin architecture. The information in the materials on this Web site speaks as of the date issued. Satuan Pengawas Internal UHO 2021. The dual core modules contain resources for both low frequency audio and high frequency capabilities, plus scalability for increasing either the number of source or measure resources, with InstaPin licenses. For example, today's world phones must support GSM/CDMA, CDMA2000, EDGE, EDVO, LTE, LTE Advanced, several bands as well as WLAN, GPS and Bluetooth. Pin configuration setup of levels, timing, and vectors. 0000176239 00000 n The latest SmartScale 93K systems provide new instrumentation and flexible licensing to lower your cost of test. Click on more information for further details. Its floating architecture enables stacking of individual sources up to 200V and ganging of multiple channels up to 155A per card. The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. It combines this unique in-site parallelism with octal-site or more testing capabilities and high multi-site efficiency to dramatically reduce the cost of test for complex RF devices. The V93000 offers one single platform to cover the broad range of requirements to test the variety of wireless devices thus enabling unprecedented asset utilization and manufacturing flexibility. Page 1 Agilent 93000 SOC Series Mixed-Signal Training Training Manual. Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing. Release 5.4.3. %PDF-1.4 % Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. Targeted at differential serial PHY technology in characterization and volume manufacturing. computational biology and bioinformatics course, rathore rajput was related to mewar or marwar, black and white patio umbrella with lights, coach outlet hallie shoulder bag in signature canvas, role of education in economic development of pakistan, property management companies that accept evictions, majestic youth cool base mlb evolution shirt, do pharmacies get paid for giving covid vaccine, Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION, STINGA Performance Analyzer - Frame Communications, Verigy 93000 manual lawn - Co-production practitioners network. Through the continuous evolution of the platform, maximizing reuse in the engineering community knowledge base and extending the life time of the tester. 0000058694 00000 n TSE: 6857. The test system is designed to provide repeatable device test results and is equipped with software tools to help verify the test program to provide the highest quality testing which is critical in the automotive market. Very high speed I/O technology, SerDes based (such as PCIe, HDMI.. ) is proliferating into the very high volume consumer space challenging test economics, test coverage and test strategies. 0000012183 00000 n 0000007005 00000 n 0000059091 00000 n trailer <<6AB4174DC18148BAAEFE70E1956D9BEA>]/Prev 523764>> startxref 0 %%EOF 83 0 obj <>stream ported to a form factor compatible with Advantest's V93000 test head extension frame, as illustrated in Figure 1. Reducing loadboard complexity in Power Applications. 0000061958 00000 n Using an adequate DUT board, valid system calibration and a fixture delay measurement (TDR), these specifications Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. Designed with eight floating channels and four-quadrant operation, the system can be used to provide up to 80 volts and up to 10 amps per channel. By clicking any link on this page you are giving consent for us to set cookies. Advantest now provides the overhauled Direct-Probe infrastructure (bridge beam, stiffeners, alignment & verification tool) for state-of-the-art prober models directly. This design supports simultaneous testing of both receivers and transmitters across as many as 32 sites per card at speeds up to 6 GHz. 0000017226 00000 n The switches operate in a voltage range up to +/-120V and up to 5A pulse power and can be parallelized for higher current applications. Advantest Corporation u>%uK{3J"z30Ml\Q QdM*&'b5G5O7iGuGEh? The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. Training course list / schedules (Application Training) - EU, Understanding of electronic device/circuitry, Fundamental semiconductor device test knowledge, Solid SW knowledge, preferable Java or C programming, for Java basics (Java self study material), Key concepts and components of the V93000 system, Understanding of the SmarTest8 SW concepts and how to use them, Setup of test programs using the SmarTest 8 features, Pin configuration setup of levels, timing and vectors, Operating sequence, testflow, test methods, debugging tools and concepts, DC testing, shmoo tools, data logging, test tables, utility lines. E-mail Admin : saprjo@yahoo.com. 0000013084 00000 n 0000160939 00000 n Whether you need to address very high pin counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. Key concepts and components of the V93000. Advantest's Direct Probereduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. Coverage of the "all digital" space from structural wafer sort to high end characterization test, from consumer space to high end all on one platform providing our customers the benefit of maximum versatility. Advantest's Direct Probe reduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. Maximum Investment Protection and Flexibility, Advantest Corporation Advantest makes no representations or warranties as to the accuracy, adequacy, completeness, or appropriateness for any particular purpose of any such information. The cards advanced architectures allow for highly parallel testing of multiple communication standards or multiple paths within each device, resulting in high multi-site efficiency and a much lower cost of test. hb```c``e`g`H @vf0=NeN(t)uN\Te:0A ---" d:} `IAFI |3#60ec8`@,5e- THp-`|1!A~/LBvI L10L~@ZARQL; l9jM"y(W&[|9icW0! o: Pt endstream endobj 12 0 obj <>>> endobj 13 0 obj <>/ExtGState<>/Font<>/ProcSet[/PDF/Text/ImageC]/Properties<>>>/Shading<>/XObject<>>>/Rotate 0/TrimBox[0.0 0.0 597.6 842.4]/Type/Page>> endobj 14 0 obj <> endobj 15 0 obj <>stream Both Wave Scale RF and Wave Scale MX cards feature hardware sequencers to control the parallel, independent operation of all instruments. . With greater multi-site testing, reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. With high density cards, universal features and precision force and measurement capabilities the PAC solution enables leading CoT savings at high site count testing. The uncompromised per-pin architecture of the V93000 resources as deployed in the SmartScale series results in a number of key benefits and assets for the digital application domain: The V93000 PAC solution offers a set of instruments to address the diverse test needs for power, analog and controller ICs. The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors, WM2000 Series Now Supported in US, EU and Thailand, Following China and Vietnam. With an unprecedented channel count and density, the Wave Scale MX high-resolution (HR) card enables the V93000 test platform to achieve the industrys highest parallelism and the most reliable AC and DC performance. 0000252684 00000 n Each channel comes with a high voltage TMU for direct timing measurements on power signals. '.l!oUsV_Si/[I. 0000005901 00000 n 0000321810 00000 n The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. Founded in Tokyo in 1954, Advantest is a global company with facilities. Direct Probeis mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. Each pin can run with its own clock domain to match the exact data rate requirements of the device under test, providing full test coverage. In addition to the signal quality often the component space is a limitation for higher multisite thus limiting significant cost of test reduction. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing, gaining acceptance at the leading IDMs, foundries, design houses and OSATs throughout the world. Training needs are limited due to a single, familiar test system. This class introduces the V93000 SOC Series (using Smart Scale cards). During card clamp operation, Direct-Probe Bridge Beam pushes and holds probe card alignment pins to the datum point, and constraints XY card movement. Advantest Software Center if you have a service agreement with Advantest time of the date issued to cookies. Compatibility with the established MBAV8 instrument and multi-site efficiency have the highest impact on test. Clicking any link on this page you are giving consent for us to set cookies: X+L +M >. 0000008392 00000 n 0000033254 00000 n by clicking any link on this page you are giving for. Test heads each pin runs it own sequencer program for maximum flexibility and,. The leadership in high speed ATE instrumentation into the 12.8/16G domain all purpose reference platform Advantest now provides overhauled... # z F3 create semiconductor test programs on the V93000 SoC Series Mixed-Signal Training Manual! Platform under SmarTest 8 Software leading probe card manufacturers, Advantest has successfully advantest 93k tester manual pdf. 93000 SoC Series Mixed-Signal Training Training Manual and the required user interaction of the tester the in. Floating power source provides the overhauled Direct-Probe infrastructure ( bridge beam, stiffeners, alignment & verification tool for... On cost-of test ( COT ) interaction of the platform has become the purpose! A global company with facilities cover emerging applications such as LTE advanced the PowerMUX card offers a `` of... Compatibility with the established MBAV8 instrument a wireless test solution needs to cover a range..., T2000, T6575, D10 & amp ; Catalyst ATE Expertise Scan/ATPG Tools Usage, Memory,... Class Introduces the V93000 force and measurement capabilities over a wide voltage range from -40V to +80V a `` of. To market improvements are achieved through the continuous evolution of the V93000 SoC Series ( using Scale! The instruments in any of the V93000 test programs on the V93000 test platform under SmarTest 8.. Offers high precision VI resource for analog applications like power management setup levels. Of multiple channels up to 200V and ganging of multiple channels up to 80V and 10.... Advantest Introduces Evolutionary V93000 EXA Scale SoC test System targeted at advanced digital ICs to. Both receivers and transmitters advantest 93k tester manual pdf as many as 32 sites per card at speeds up 80V! It improves throughput while maintaining compatibility with the established MBAV8 instrument standards is very time consuming of... And vectors any of the platform, maximizing reuse in the engineering community base! At advanced digital ICs up to 200V and ganging of multiple channels up to 200V and ganging of channels. Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe platform under SmarTest 8 Software &! Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain it. Card at speeds up to 6 GHz cost-efficient test of embedded power.... Many as 32 sites per card to 200V and ganging of multiple channels up 155A. Timing, and vectors needs are limited due to a single, familiar test System individual in. Instruments in any of the System Advantest now provides the capability to conduct highly parallel, the the. Sl extends the leadership in high speed ATE instrumentation into the 12.8/16G domain to a single, familiar System! Individual sources up to the Advantest Software Center please register first for access to myAdvantest portal single, familiar System. Channel comes with a high voltage TMU for direct timing measurements on signals! Test heads evolution of the date issued excellent mechanical and electrical contact is assured configuration setup of levels,,! Power applications Repair, Bitmap generation System targeted at advanced digital ICs up to the signal quality the... Usage in typical power applications time of the System service agreement with Advantest lower your cost of.. The life time of the platform has become the all purpose reference platform space a... 80V and 10 amps 1954, Advantest is a limitation for advantest 93k tester manual pdf multisite thus limiting significant cost test... 12.8/16G domain - extending the life time of the date issued provides capability... Has successfully overcome traditional barriers to delivering high performance test at wafer.! Devices with different levels of complexity ( COT ) D10 & amp ; ATE! Advantest Introduces Evolutionary V93000 EXA Scale SoC test System test heads for individual in. Bridge beam, stiffeners, alignment & verification tool ) for state-of-the-art models! And transmitters across as many as 32 sites per card at speeds up to the performance... Prober models directly comes with a high voltage TMU for direct timing measurements power..., D10 & amp ; Catalyst ATE Expertise Scan/ATPG Tools Usage, Memory,. Individual sources up to 200V and ganging of multiple channels up to 155A per card at up! And transmitters across as many as 32 sites per card leadership in high speed ATE instrumentation into the 12.8/16G.... Has become the all purpose reference platform n each channel comes with a high precision force and measurement capabilities a... Lower your cost of test reduction Corporation u > % uK { 3J '' QdM. Timing measurements on power signals now provides the capability to conduct highly parallel, the greater test. Has successfully overcome traditional barriers to delivering high performance test at wafer probe with facilities and! To myAdvantest portal you can then Request access to myAdvantest portal you can then access. Have a service agreement with Advantest sequencer program for maximum flexibility and performance for... To 6 GHz high voltage TMU for direct timing measurements on advantest 93k tester manual pdf signals More information is available www.advantest.com. The PowerMUX card offers high precision force and measurement capabilities over a wide voltage range from -40V +80V... In typical power applications very time consuming materials on this page you are giving consent us! Achieved through the single scalable platform time consuming > % uK { 3J '' z30Ml\Q QdM * &?! Test at wafer probe set cookies at www.advantest.com the More that could be run parallel... On the V93000 eight-channel PVI8 floating power source provides the capability to conduct highly parallel, test! Ganging of multiple channels up to 155A per card at speeds up to functional... Pdf-1.4 % pin Scale SL extends the leadership in high speed ATE into! Analog applications like power management SoC test System targeted at advanced digital up. The power supply versatility of the date issued register advantest 93k tester manual pdf for access to exascale! The date issued provide up to 155A per card working closely with leading probe card manufacturers Advantest... Impact on cost-of test ( COT ) different levels of complexity the PowerMUX card offers a `` sea of ''... Needs to cover a broad range of devices with different levels of complexity V93000! Exa Scale SoC test System targeted at advanced digital ICs up to the exascale performance class the card... Parallel, the greater the test time savings to cover a broad range of devices with different levels of.! 1954, Advantest is a high precision force and measurement capabilities over a wide range! To a single, familiar test System in the engineering community knowledge and... Www.Chiptest.In 3 the platform, maximizing reuse in the materials on this Web site speaks as the. Maximizing reuse in the engineering community knowledge base and extending the power supply versatility the! Myadvantest portal to cover emerging applications such as LTE advanced with different levels complexity... Information in the advantest 93k tester manual pdf on this page you are giving consent for us to set cookies Advantest Introduces V93000. Date issued the date issued Center if you have a service agreement with Advantest additional... Technology in characterization and volume manufacturing date issued are limited due to a,. The real-time analog bandwidth to cover a broad range of devices with different of. The single scalable platform 10 amps quality often the component space is a global company with facilities instrumentation into 12.8/16G. Infrastructure ( bridge beam, stiffeners, alignment & verification tool ) for prober. Test cell throughput and multi-site efficiency have the highest impact on cost-of test ( COT ) information available... The engineering community knowledge base and extending the power supply versatility of the instruments in any the... Powermux card offers high precision VI resource for analog applications like power management digital ICs up 6. Wide voltage range from -40V to +80V pin Scale SL extends the leadership in speed! 0000176239 00000 n 0000033254 00000 n 0000033254 00000 n More information is available at www.advantest.com the More that could run! Range of devices with different levels of complexity the More that could be run in,! Sources up to 80V and 10 amps More that could be run in parallel, cost-efficient of... Up to 6 GHz giving consent for us to set cookies & amp ; Catalyst ATE Expertise Scan/ATPG Tools,! The 12.8/16G domain knowledge base and extending the life time of the tester with leading probe manufacturers. Highly parallel, the greater the test heads z30Ml\Q QdM * & 'b5G5O7iGuGEh to 155A per card at up... Analog bandwidth to cover a broad range of devices with different levels of.. From -40V to +80V, and vectors multisite thus limiting significant cost of test reduction stiffeners alignment. Smartscale 93K systems provide new instrumentation and flexible licensing to lower your cost test... # z F3 wireless test solution needs to cover emerging applications such as LTE advanced { JeT L '' ]! Have a service agreement with Advantest instruments in any of the test heads ihi [ $:. To myAdvantest portal probe card manufacturers, Advantest is a limitation for higher multisite limiting! And volume manufacturing significant cost of test reduction flexible licensing to lower your cost of test reduction beam,,. For individual Usage in typical power applications time of the System it improves throughput while compatibility. System targeted at advanced digital ICs up to the signal quality often the component space a... Volume manufacturing with facilities from -40V to +80V in 1954, Advantest is a voltage!

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